VERDIER Marc

• AFM/MFM (scanning probe measurements) || Local mechanical properties
• Local Mechanical properties (Nanoindentation - Contact Resonant AFM)

• Materials Science for thin films

RESEARCH

Fields of interest

• Physics of crystalline plastic deformation mechanisms (dislocation theory, strain hardening)

• Structural stability and mechanical properties of small scall systems

Tools

• Diffraction with coherent x-rays

• Local mechanical properties measurements (nanoindentation insitu FEG / Synchrotron, SPMs)

• Growth of structures (thin films, polycristalline structures, whiskers)

Applied research

• Semiconductor industry : CMOS interconnects level (Cu, ULK), wafer bonding

• Structural materials (Al-alloys , steels)

Publications

• Dupraz, M.; Beutier, G.; Rodney, D.; Mordehai, D. & Verdier, M. (2015), 'Signature of dislocations and stacking faults of face-centred cubic nanocrystals in coherent X-ray diffraction patterns: a numerical study', Journal of Applied Crystallography 48, 621--644.

• Labat, S.; Richard, M.-I.; Dupraz, M.; Gailhanou, M.; Beutier, G.; Verdier, M.; Mastropietro, F.; Cornelius, T. W.; Schuelli, T. U.; Eymery, J. & Thomas, O. (2015), 'Inversion Domain Boundaries in GaN Wires Revealed by Coherent Bragg Imaging', Acs Nano 9(9), 9210--9216.

• Lai, Q.; Bouaziz, O.; Goune, M.; Brassart, L.; Verdier, M.; Parry, G.; Perlade, A.; Brechet, Y. & Pardoen, T. (2015), 'Damage and fracture of dual-phase steels: Influence of martensite volume fraction', Materials Science and Engineering A-structural Materials Properties Microstructure and Processing 646, 322--331.

• Gondcharton, P.; Imbert, B.; Benaissa, L. & Verdier, M. (2015), 'Voiding Phenomena in Copper-Copper Bonded Structures: Role of Creep', ECS Journal of Solid State Science and Technology 4(3), P77--P82.

• Gondcharton, P.; Imbert, B.; Benaissa, L.; Fournel, F. & Verdier, M. (2015), 'Effect of Copper-Copper Direct Bonding on Voiding in Metal Thin Films', Journal of Electronic Materials 44(11), 4128--4133.

• Gondcharton, P.; Imbert, B.; Benaissa, L.; Carron, V. & Verdier, M. (2015), 'Kinetics of low temperature direct copper-copper bonding', Microsystem Technologies-micro-and Nanosystems-information Storage and Processing Systems 21(5), 995--1001.
• Ren, Z.; Mastropietro, F.; Davydok, A.; Langlais, S.; Richard, M.-I.; Furter, J.-J.; Thomas, O.; Dupraz, M.; Verdier, M.; Beutier, G.; Boesecke, P. & Cornelius, T. W. (2014), 'Scanning force microscope for in situ nanofocused X-ray diffraction studies', Journal of Synchrotron Radiation 21, 1128—1133.

• Chen, M. .. Y.; Goune, M.; Verdier, M.; Brechet, Y. & Yang, J. .. R. (2014), 'Interphase precipitation in vanadium-alloyed steels: Strengthening contribution and morphological variability with austenite to ferrite transformation', Acta Materialia 64, 78--92.