Transmission electron microscopy (TEM) has established itself as a powerful and versatile platform for exploring structure–property relationships at the nanoscale. TEM offers direct access to phase distribution, interface structure, and crystallographic texture in these films, providing essential information for correlating fabrication conditions with performance. This seminar will present a new approach to mapping phases rather than elements, based on a novel blind source separation strategy for the components of a multimodal dataset (EELS, EDX, imaging). We will illustrate the many advantages of this strategy, as well as its limitations compared to conventional elemental mapping methods, using numerous examples ranging from nanoparticles used in heterogeneous catalysis to composite thin films.