Picture of the month - April 2020

SEM image of a SiOCH thin film on silicon substrate after a nanocompression test. The mechancial testing was coupled with electric measurements thanks to a potential difference applied between the substrate and the boron-doped diamond tip. The leakage current throught the dielectric material could then be measured during the mechanical damaging of the film that gave birth to this pretty spring flower.





About the author : Morgan RUSINOWICZ is a first year PhD student in PM group. His work concerns the properties of oxide layers in relation with their microstructure, and more particularly the coupling between mechanical and electrical properties.