Séminaire de Simon ZABLER, professeur au Technische Hochschule Deggendorf

Industrial X-ray Computed Tomography (CT) is widely used in materials science as well as for industrial inspection. Along with a large variety of measurement tasks comes a number of different instruments and CT methods, such as Micro-CT, Robo-CT or X-ray Phase Contrast and Darkfield CT. While the problem of Robotic CT lies in achieving pixel-precision trough calibration and image processing, micro-CT can make use of diffusion and deflection of X-rays thus adding new contrast modalities to attenuation which is the most common signal. By using additional beam-shaping devices, such as pinhole arrays or micro-gratings one can upgrade state-of-the-art Micro-CT scanners for recording even tensorial materials properties such as the anisotropic scattering of light by sub-pixel fibrous structure.